About the NITLE DSpace Service

» NITLE DSpace Service > Washington College > Natural Science > Psychology > Washington College Psychology Senior Capstone Experience >

Please use this identifier to cite or link to this item: http://hdl.handle.net/10090/3869

Title: From parent to child: the transmission of parental psychopathology and its residual effects on the parent-child relationship
Other Titles: Parental psychopathology
Authors: Sullivan, Allison
Issue Date: 6-Feb-2008
Abstract: In the current study, parental psychopathology and its effect on satisfaction with the parent-child relationship was investigated. College students’ reports on their own psychopathology, their parents’ mental health, and anxiety levels were examined. Fiftyseven participants were grouped based on parental psychopathology and their own mental illness. They completed the Parent-Child Relationship Survey (PCRS) and the Clinical Anxiety Scale (CAS). While there was no significant difference in the ratings of fathers, three of the four PCRS subscales within the mother version revealed significantly poorer relationship quality for participants whose mothers were diagnosed. Participants who had a mentally ill parent also reported significantly higher anxiety levels. Participants who reported having a mental illness also displayed significantly higher anxiety levels than those who were without illness. Results are discussed in light of the importance of including the entire family in mental health services and early preventative measures for the child.
Description: A Senior Capstone Experience thesis submitted to the Washington College Department of Psychology in partial fulfillment of the Bachelor of Arts degree requirements.
URI: http://hdl.handle.net/10090/3869
Appears in Collections:Washington College Psychology Senior Capstone Experience

Files in This Item:

File Description SizeFormat
Sullivan_PSY.pdf463KbAdobe PDFView/Open

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

 

DSpace Software Copyright © 2002-2006 MIT and Hewlett-Packard - Feedback